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Scanning electron microscope Quattro S
The Quattro S scanning electron microscope allows us to investigate a wide range of materials up to biological objects using various modes of such as high vacuum mode, low vacuum mode up to 200 Pa or environmental mode up to 4000 Pa. The morphology of particles, coatings and thin films, the structure of metals and alloys, etc., as well as their elemental and phase composition can be investigated using a Quattro S microscope equipped with EDX detector.
Production year, manufacturer, country of manufacture: 2018, TFS (ThermoFisherScientific), Netherlands
Technical characteristics:
Electron beam resolution
High-vacuum imaging
1.0 nm at 30 kV
Low-vacuum imaging up to 200 Pa
1.3 nm at 30 kV (SE)
3.0 nm at 3 kV (SE)
ESEM up to 4000 Pa
1.3 nm at 30 kV (SE)
Beam current range:
1 pA to 200 nA
Accelerating voltage range:
200 V – 30 kV
Landing energy range:
20 eV – 30 keV with optional beam deceleration.
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