Main services

Name of service

Used equipment

Unit of measurement, sample

1

Particle morphology investigation

Scanning electron microscope Quattro S

1 sample

2

Surface morphology investigation of the sample, if necessary, the use of a backscattered electron detector

Scanning electron microscope  Quattro S

1 sample

3

Investigation of the elemental composition of the sample (by 5 points)

Scanning electron microscope  Quattro S

1 sample

4

Investigation of the elemental composition of the sample (mapping of 3 areas)

Scanning electron microscope  Quattro S

1 sample

5

Particle morphology investigation

Dual beam scanning electron microscope  Helios G4

1 sample

6

Surface morphology investigation of the sample, if necessary, the use of a backscattered electron detector

Dual beam scanning electron microscope Helios G4

1 sample

7

Investigation of the elemental composition of the sample (by 5 points)

Dual beam scanning electron microscope Helios G4

1 sample

8

Investigation of the elemental composition of the sample (mapping of 3 areas)

Dual beam scanning electron microscope Helios G4

1 sample

9

Preparation and visualization of cross-section

Dual beam scanning electron microscope Helios G4

1 sample

10

Preparation of lamella for TEM investigation

Dual beam scanning electron microscope Helios G4

1 sample

11

Preparation of lamella for TEM investigation at the given point in accordance with Customer request

Dual beam scanning electron microscope Helios G4

1 sample

12

Investigation of multilayer structures in the STEM mode, including investigation of the elemental composition of the sample (along the line)

Dual beam scanning electron microscope Helios G4

1 sample

13

Investigation of the crystallographic orientation of the grain structure (EBSD)

Dual beam scanning electron microscope Helios G4

1 sample

14

Investigation of the morphology of nanoparticles in TEM or STEM modes

Transmission electron microscope Titan Themis Z

1 sample

15

Investigation of the grain structure of a sample including determination of dislocation density

Transmission electron microscope Titan Themis Z

1 sample

16

Investigation of the crystal structure of a sample using electron diffraction

Transmission electron microscope Titan Themis Z

1 sample

17

Visualization of the crystal structure of the sample in high resolution TEM or STEM

Transmission electron microscope Titan Themis Z

1 sample

18

Solution of the crystal structure of a sample using electron diffraction tomography

Transmission electron microscope Titan Themis Z

1 sample

19

Investigation of the elemental composition of the sample using energy dispersive X-ray spectroscopy (EDX) (mapping of 3 areas)

Transmission electron microscope Titan Themis Z

1 sample

20

Mapping of the elemental composition of the sample using energy dispersive x-ray spectroscopy (EDX) with atomic resolution (mapping of 3 areas)

Transmission electron microscope Titan Themis Z

1 sample

21

Investigation of the elemental composition of the sample, including light elements, using electron energy loss spectroscopy (EELS) (spectra acquisition at 5 points)

Transmission electron microscope Titan Themis Z

1 sample

22

Mapping of the elemental composition of the sample, including light elements, using electron energy loss spectroscopy (EELS) in the STEM mode (mapping of 3 areas)

Transmission electron microscope Titan Themis Z

1 sample

23

Visualization of nanoparticles using electron tomography

Transmission electron microscope Titan Themis Z

1 sample

24

Visualization of multilayer structures (heterostructures) with atomic resolution

Transmission electron microscope Titan Themis Z

1 sample