|
№ |
Name of service |
Used equipment |
Unit of measurement, sample |
|
1 |
Particle morphology investigation |
Scanning electron microscope Quattro S |
1 sample |
|
2 |
Surface morphology investigation of the sample, if necessary, the use of a backscattered electron detector |
Scanning electron microscope Quattro S |
1 sample |
|
3 |
Investigation of the elemental composition of the sample (by 5 points) |
Scanning electron microscope Quattro S |
1 sample |
|
4 |
Investigation of the elemental composition of the sample (mapping of 3 areas) |
Scanning electron microscope Quattro S |
1 sample |
|
5 |
Particle morphology investigation |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
6 |
Surface morphology investigation of the sample, if necessary, the use of a backscattered electron detector |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
7 |
Investigation of the elemental composition of the sample (by 5 points) |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
8 |
Investigation of the elemental composition of the sample (mapping of 3 areas) |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
9 |
Preparation and visualization of cross-section |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
10 |
Preparation of lamella for TEM investigation |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
11 |
Preparation of lamella for TEM investigation at the given point in accordance with Customer request |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
12 |
Investigation of multilayer structures in the STEM mode, including investigation of the elemental composition of the sample (along the line) |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
13 |
Investigation of the crystallographic orientation of the grain structure (EBSD) |
Dual beam scanning electron microscope Helios G4 |
1 sample |
|
14 |
Investigation of the morphology of nanoparticles in TEM or STEM modes |
Transmission electron microscope Titan Themis Z |
1 sample |
|
15 |
Investigation of the grain structure of a sample including determination of dislocation density |
Transmission electron microscope Titan Themis Z |
1 sample |
|
16 |
Investigation of the crystal structure of a sample using electron diffraction |
Transmission electron microscope Titan Themis Z |
1 sample |
|
17 |
Visualization of the crystal structure of the sample in high resolution TEM or STEM |
Transmission electron microscope Titan Themis Z |
1 sample |
|
18 |
Solution of the crystal structure of a sample using electron diffraction tomography |
Transmission electron microscope Titan Themis Z |
1 sample |
|
19 |
Investigation of the elemental composition of the sample using energy dispersive X-ray spectroscopy (EDX) (mapping of 3 areas) |
Transmission electron microscope Titan Themis Z |
1 sample |
|
20 |
Mapping of the elemental composition of the sample using energy dispersive x-ray spectroscopy (EDX) with atomic resolution (mapping of 3 areas) |
Transmission electron microscope Titan Themis Z |
1 sample |
|
21 |
Investigation of the elemental composition of the sample, including light elements, using electron energy loss spectroscopy (EELS) (spectra acquisition at 5 points) |
Transmission electron microscope Titan Themis Z |
1 sample |
|
22 |
Mapping of the elemental composition of the sample, including light elements, using electron energy loss spectroscopy (EELS) in the STEM mode (mapping of 3 areas) |
Transmission electron microscope Titan Themis Z |
1 sample |
|
23 |
Visualization of nanoparticles using electron tomography |
Transmission electron microscope Titan Themis Z |
1 sample |
|
24 |
Visualization of multilayer structures (heterostructures) with atomic resolution |
Transmission electron microscope Titan Themis Z |
1 sample |
